AT semicon provides wafer test and final test services for all types of semiconductor ICs, having established infrastructure that can test all semiconductors including memory and system semiconductors.

  • Wafer Test

    AT semicon provides various wafer test services. Not limited to wafer test services, we also provides all wafer-related test services such as the development of test programs, laser repair, automatic visual inspection, and wafer-level burn-in tests. Wafer tests can be performed within the temperature range of -55℃ through 150℃ for all existing wafers having the sizes between 5" and 12".

  • Final Test

    AT semicon provides various package test services. The range of AT semicon’s final test service includes basic tests on electric attributes, as well as development of test programs and fabrication of interfaces that fit attributes of customer products.
    AT semicon provides tests on devices having various package types, such as SOP, TSOP, TSOP2, SSOP, QFP, QFL, LGFP, TQP, QFN, BGA, FBGA, LGA, SIP, flip-chip F-BGA, and MCP (memory + memory, memory + system IC, system IC + system IC).
    Final tests can be performed within the temperature range of -55℃ through 150℃ for memory semiconductors having 32Para through 1024Para, and for system semiconductors having 1Para through 16Para.

  • Back-end Services

    For tested products, AT semicon provides various back-end services related with semiconductor tests such as laser marking, visual inspection, and baking, as well as convenient drop shipping services from packaging (tape, reel, or tray) to delivery upon customer requests.